Call for Papers

Call for Papers

Original papers in, but not limited to the following areas are invited:

[1] System-Level Modeling and Design Methodology
  • 1.1 HW/SW co-design, co-simulation and co-verification

  • 1.2 System-level design exploration, synthesis and optimization

  • 1.3 System-level formal verification

  • 1.4 System-level modeling, simulation and validation

  • 1.5 Networks-on-chip and NoC-based system design

  • 1.6 Hardware construction using Scala-embedded languages

[2] Memory Architecture and Near/In-Memory Computing
  • 2.1 Storage systems and memory architecture

  • 2.2 On-chip memory architectures and management: scratchpads, compiler-controlled memories, etc.

  • 2.3 Memory/storage hierarchies and management for emerging memory technologies

  • 2.4 Near-memory and in-memory computing


[3] Analog and Mixed-Signal Design Automation
  • 3.1 Analog/mixed-signal/RF synthesis

  • 3.2 Analog layout, verification and simulation techniques

  • 3.3 High-frequency electromagnetic simulation of circuits

  • 3.4 Mixed-signal design considerations

[4] High-Level, Behavioral, and Logic Synthesis and Optimization
  • 4.1 Digital simulation and emulation

  • 4.2 High-level synthesis

  • 4.3 Logic synthesis

  • 4.4 Synthesis for approximate computing


[5] Analysis and Optimization for Power and Timing
  • 5.1 Deterministic/statistical timing analysis and optimization

  • 5.2 Process technology modeling for timing analysis

  • 5.3 Power modeling, analysis and simulation

  • 5.4 Low-power design and optimization at circuit and system levels

  • 5.5 Thermal-aware design and dynamic thermal management

  • 5.6 Energy harvesting and battery management

[6] Physical Implementation
  • 6.1 Floorplanning, partitioning, placement and routing optimization

  • 6.2 Interconnect planning and synthesis

  • 6.3 Clock network synthesis

  • 6.4 Physical design of 3D/2.5D ICs and packages (e.g., TSV, interposer, monolithic)

  • 6.5 Post-layout and post-silicon optimization

  • 6.6 Layout verification


[7] Testing, Validation, Simulation, and Verification
  • 7.1 RTL and gate-level modeling, simulation and verification

  • 7.2 Circuit-level formal verification

  • 7.3 ATPG, BIST and DFT

  • 7.4 System test and 3D IC test, online test and fault tolerance

  • 7.5 Memory test and repair

[8] Design for Manufacturability and Reliability
  • 8.1 Design-technology co-optimization (DTCO)

  • 8.2 Standard and custom cell design and optimization

  • 8.3 Reticle enhancement, lithography-related design optimization and design rule checking

  • 8.4 Design for manufacturability, yield, defect tolerance, cost issues and DFM impact

  • 8.5 Device-, gate- and circuit-level reliability analysis and optimization (e.g., soft errors, aging)

  • 8.6 Post-layout optimization


[9] Packaging and Multi-Physics Simulation
  • 9.1 Extraction, TSV and package modeling

  • 9.2 Chiplet design and design tools

  • 9.3 Chip-level thermal simulation

  • 9.4 Packaging stress analysis

  • 9.5 Multi-physics simulation

  • 9.6 Signal/power integrity, EM modeling and analysis

[10] Technology and Modeling
  • 10.1 Device compact modeling

  • 10.2 Process design kits

  • 10.3 Semiconductor process and device simulation

  • 10.4 Cell library design, characterization and verification

  • 10.5 New transistor/device and process technologies: spintronic, phase-change, single-electron, 2D materials, etc.


[11] Emerging Technologies and Applications
  • 11.1 Biomedical, biochip, nanotechnology and MEMS

  • 11.2 Design automation for 3D ICs and heterogeneous integration

  • 11.3 Design automation for quantum computing

  • 11.4 Design automation for silicon photonics

  • 11.5 Design automation and verification for compound semiconductors

[12] AI and Open Source EDA
  • 12.1 Artificial intelligence for EDA

  • 12.2 Cloud and parallel computing for EDA

  • 12.3 Open source EDA

  • 12.4 EDA databases

  • 12.5 EDA standardization