Original papers in, but not limited to the following areas are invited:
1.1 HW/SW co-design, co-simulation and co-verification
1.2 System-level design exploration, synthesis and optimization
1.3 System-level formal verification
1.4 System-level modeling, simulation and validation
1.5 Networks-on-chip and NoC-based system design
1.6 Hardware construction using Scala-embedded languages
2.1 Storage systems and memory architecture
2.2 On-chip memory architectures and management: scratchpads, compiler-controlled memories, etc.
2.3 Memory/storage hierarchies and management for emerging memory technologies
2.4 Near-memory and in-memory computing
3.1 Analog/mixed-signal/RF synthesis
3.2 Analog layout, verification and simulation techniques
3.3 High-frequency electromagnetic simulation of circuits
3.4 Mixed-signal design considerations
4.1 Digital simulation and emulation
4.2 High-level synthesis
4.3 Logic synthesis
4.4 Synthesis for approximate computing
5.1 Deterministic/statistical timing analysis and optimization
5.2 Process technology modeling for timing analysis
5.3 Power modeling, analysis and simulation
5.4 Low-power design and optimization at circuit and system levels
5.5 Thermal-aware design and dynamic thermal management
5.6 Energy harvesting and battery management
6.1 Floorplanning, partitioning, placement and routing optimization
6.2 Interconnect planning and synthesis
6.3 Clock network synthesis
6.4 Physical design of 3D/2.5D ICs and packages (e.g., TSV, interposer, monolithic)
6.5 Post-layout and post-silicon optimization
6.6 Layout verification
7.1 RTL and gate-level modeling, simulation and verification
7.2 Circuit-level formal verification
7.3 ATPG, BIST and DFT
7.4 System test and 3D IC test, online test and fault tolerance
7.5 Memory test and repair
8.1 Design-technology co-optimization (DTCO)
8.2 Standard and custom cell design and optimization
8.3 Reticle enhancement, lithography-related design optimization and design rule checking
8.4 Design for manufacturability, yield, defect tolerance, cost issues and DFM impact
8.5 Device-, gate- and circuit-level reliability analysis and optimization (e.g., soft errors, aging)
8.6 Post-layout optimization
9.1 Extraction, TSV and package modeling
9.2 Chiplet design and design tools
9.3 Chip-level thermal simulation
9.4 Packaging stress analysis
9.5 Multi-physics simulation
9.6 Signal/power integrity, EM modeling and analysis
10.1 Device compact modeling
10.2 Process design kits
10.3 Semiconductor process and device simulation
10.4 Cell library design, characterization and verification
10.5 New transistor/device and process technologies: spintronic, phase-change, single-electron, 2D materials, etc.
11.1 Biomedical, biochip, nanotechnology and MEMS
11.2 Design automation for 3D ICs and heterogeneous integration
11.3 Design automation for quantum computing
11.4 Design automation for silicon photonics
11.5 Design automation and verification for compound semiconductors
12.1 Artificial intelligence for EDA
12.2 Cloud and parallel computing for EDA
12.3 Open source EDA
12.4 EDA databases
12.5 EDA standardization